EMMA XRD

The original design of the MMA included such features as interchangeable parallel beam and focusing geometries, variable radius, provision for multiple detectors, interchangeable optics and many different stages.

• θ-θ mode - to maintain a horizontal sample stage, essential for high temperature and non-ambient sample chambers.
• New advanced microprocessor controller, offering 8 simultaneous axes and Ethernet comms. εMMA has an IP address on a network, and can be driven from any PC on the network, or indeed the Internet, subject to bandwidth and other packet data constraints.
• New sample stages for large, heavy and bulky samples, in addition to spinning, capillary spinner, and mounting provision for a select few non-ambient stages available from PAAR ®.
• New primary beam optics such as confocal graded d-spacing mirror for transmission and Capillary modes.
• New software enhancements - includes an "accessory picker" that allows instant re-calibration after interchange of any beam component for Visual XRD. Traces includes integrations with the latest release of the ICDD databases PDF-2 and PDF-4+.

Much work has been done on thin film, surface analysis, depth profiling and reflectometry using a parallel beam detector with a very fine divergence slit. This gives particularly impressive results when used with the unique Solid-State Peltier-cooled Si PIN Diode detector. This detector offers 3 x - 4 x better sensitivity then the traditional Xe proportional detector with a curved graphite crystal monochromator.

For rapid interchange options, each stage, optic and detector has its own calibration and swapping configurations as easy as selecting a new item from the accessories picker.